Features
- up to 100 flakes per hour
- optimized for rigid flakes
- 96 positions per tray
- 2 trays per run
- FTIR and XRF integration
Options
- different tray sizes
- tabletop or standalone
- uniform sample preparation tool
Effortless Operation, Full Control
The OWL's software interface is designed for simplicity and efficiency, allowing operators to get up and running with minimal effort. Measurements can be run fully automatically or as individual single measurements, giving users the flexibility to match their workflow.
Setting up a new batch takes just seconds. Simply select an existing batch or create a new one, load a standard 96-position tray, select XRF, FTIR, or both, and hit start. The system then works through all 96 positions autonomously, with a live progress indicator keeping the operator informed at all times.
The Tray Overview screen provides an immediate visual snapshot of the measurement status. Each of the 96 positions is color-coded in real time — green for measured and red for not yet measured — so operators can see at a glance how the analysis is progressing. With all 96 positions tracked in a single view, quality control has never been this transparent or effortless.
This intuitive interface, combined with the OWL's automated hardware, means that running a full batch analysis requires minimal operator involvement, freeing up time while delivering detailed, traceable results on every single flake.
Detailed Analysis at Every Level
Once a batch is complete, the OWL's analysis screens bring the data to life. Results can be consulted at two levels: batch level for a broad overview of the entire sample, or flake level for a deep dive into any individual particle.
At the flake level, the spectrum analysis screen shows the full FTIR spectral signature of each measured position, with the highest-matching plastic type and confidence score displayed prominently. In the example shown, position A3 is identified as Polyethylene (PE) with a match rate of 94.7%. Alongside the FTIR spectrum, the XRF composition chart breaks down the elemental makeup of that same flake, giving a complete picture of both plastic type and elemental content in a single view.
At the batch level, the analysis screen provides an instant overview of the entire run. A composition pie chart visualizes the distribution of elements across all measured flakes, while the XRF analysis bar chart shows the concentration of each detected element. The reference library used for identification is clearly displayed, ensuring full traceability and reproducibility across measurements.
When the analysis is done, results can be exported directly to the cloud or to USB, making it straightforward to integrate OWL data into existing quality management or reporting workflows.
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